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    • Extended input space support vector machine 

      Santiago-Mozos, Ricardo; Pérez-Cruz, Fernando; Artés-Rodríguez, Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2011-01-01)
      In some applications, the probability of error of a given classifier is too high for its practical application, but we are allowed to gather more independent test samples from the same class to reduce the probability of ...